Encouraged by recent efforts by MIG and its MEMS testing standards steering committee, SEMI’s Paula Doe sat down with several MIG members to talk about MEMS testing protocols. As more MEMS companies adopt the fabless business model, the balance between the need for a common language, measurement parameters, and test techniques while still protecting a company’s process – or special sauce – is increasingly critical. Paula’s article demonstrates the value proposition of MIG’s project. Some of these protocols already exist and our goal is not to reinvent the wheel. MIG is shining a light on existing protocols and naming them what they really are – MEMS Standards. Ah, that wasn’t so hard to say…
I encourage you to comment below and post your thoughts. Better yet, join us at one of two of our MEMS testing standards workshops. The first is an informal meeting in Cancun during IEEE MEMS on January 26, 2011 from 5-6:30. Stop by booth 35 to see MIG’s Karen Lightman and NIST’s Michael Gaitan. They’ll give you all the details. For a moderated working-group-format discussion about MEMS inertial sensor testing protocols, join us in San Jose on March 16, 2011 the day before MIG’s annual members’ meeting M2M. For complete details, and to register, visit the MIG web site.
Maturing MEMS Sector Moves towards Common Testing Protocols
By Paula Doe, SEMI Emerging Markets, originally posted on SEMI’s website
MEMS folks haven’t typically had use for cooperating on standards efforts, with the wide variety of diverse mechanical structures they make, and the process technology IP that’s still a core competitive advantage. But the maturing sector is starting to see an increasing need for a common language of testing and characterization to help ease communication with outsiders, both outside manufacturing partners and the ever-wider range of customers not expert in MEMS.
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